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Surface defect inspection equipment Product List and Ranking from 4 Manufacturers, Suppliers and Companies | IPROS GMS

Surface defect inspection equipment Product List

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Collaborative Project Product Series

Collaborative Project Product Series

Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.

  • Other inspection equipment and devices
  • Surface defect inspection equipment

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Inline inspection device "CONTACT ACE series"

Inline inspection device "CONTACT ACE series"

Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Surface defect inspection equipment

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Inline inspection device "AIRIS ACE series"

Inline inspection device "AIRIS ACE series"

Emphasizing ease of use and expandability! A surface defect inspection device that can adapt flexibly to meet your needs!

The "AIRIS ACE Series" is an inline surface defect inspection device designed to match the characteristics of each industry. Considering the needs that will arise in 5 to 10 years, we emphasize expandability in both hardware and software. We support our customers with ease of use. We offer the base model of the series, "AIRIS-UC," and the "AIRIS-SP," which includes additional criteria for defect classification to meet a wider range of needs. 【Features】 ■ High expandability / Additional cameras and series ■ Multilingual support on the same platform ■ CoaXPress interface adopted ■ Processing capability improved by four times ■ Power consumption reduced by 43% *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Surface defect inspection equipment

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Inline inspection device "FITS-3 Series"

Inline inspection device "FITS-3 Series"

Up to 4 series and expandable to 16 cameras! High resolution makes it possible to detect difficult defects!

The "FITS series" is a surface defect detection device that allows for the addition of cameras and series. With high resolution, it enables defect detection that is difficult to differentiate from the background. Algorithms effective for detecting uneven defects in strong backgrounds and faint line defects have become available. Additionally, the discrimination function allows for the classification of defects by type. 【Features】 ■ Can add cameras and series (up to 4 series, 16 cameras maximum) ■ Capable of compression processing ■ Can automatically identify the types of defects ■ A lineup that can be selected according to needs *For more details, please contact us.

  • Other inspection equipment and devices
  • Surface defect inspection equipment

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Marking Device Series

Marking Device Series

A wide variety of options are available, including compact and lightweight types, as well as models compatible with clean environments!

Ayaha Engineering offers a variety of "marking devices" tailored to product sizes, processing lines, and detected defects, ranging from film inspection, sheet inspection, and web inspection to non-woven fabric inspection, electrode sheet inspection, copper plate inspection, steel plate inspection, and metal foil inspection. The "AMK-Mini" separates the control box from the main unit, achieving ultra-compact and ultra-lightweight design. This allows for installation in locations that were previously difficult to access. Additionally, we have options like the "AMK-Clean," which can be installed in clean environments, and the controller-integrated type "AMK-S1." 【Features (AMK-Mini)】 ■ Separation of the control box from the main unit for ultra-compact and ultra-lightweight design ■ Enables installation in locations that were previously difficult to access ■ Standard equipped with label remaining quantity monitoring function ■ Signal output when labels run out using a countdown method *For more details, please contact us.

  • Other inspection equipment and devices
  • Other markings
  • Surface defect inspection equipment

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Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. Not only does simultaneous irradiation with multiple lasers allow for high-sensitivity detection of scratches, but it also determines the uneven shapes of the defects. Features: - Detection of micro defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Full auto-focus - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

  • others
  • Surface defect inspection equipment

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Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customizable options ■ Supports automatic inspection of one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment
  • Surface defect inspection equipment

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[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

Don't overlook any shortcomings even on high-speed lines! This product is a must-see for anyone involved in the production lines of the three-product industry!

"Mujiken-Ex" is a system that inspects surface defects (such as scratches, dirt, and foreign objects) on plain materials like film, paper, and metal, which are transported at high speeds in various production and processing environments. It is also suitable for inspecting materials used for containers, packaging, and labels in cosmetics and pharmaceuticals. If the material is in a web (sheet) form, it can inspect a wide variety of products without selecting the measured object or substrate. By hardware (board) implementing a self-developed high-speed processing circuit dedicated to inspection, it achieves approximately twice the image processing of standard machines while maintaining a high level of accuracy in appearance inspection. 【Features】 ■ Image Processing: High-speed image processing capabilities with a rich set of algorithms ■ Optical System: High-speed compatible cameras. Long-distance and high-speed communication support ■ Diverse system configurations *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Surface defect inspection equipment

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Label marker (compatible with low, medium, and high-speed lines)

Label marker (compatible with low, medium, and high-speed lines)

Label marker (compatible with low, medium, and high-speed lines)

■It features a low price and compact design that breaks common sense. ■Easy to install, lightweight type. ■Sensor adjustment can be easily performed.

  • Commercial printers
  • Image Processing Equipment
  • Surface defect inspection equipment

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Offline inspection device "MICRO ACE series"

Offline inspection device "MICRO ACE series"

Customizable! A lineup of offline inspection devices capable of high-resolution testing.

The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.

  • Other inspection equipment and devices
  • Surface defect inspection equipment

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Murabiyuwaa

Murabiyuwaa

It is possible to automatically detect and visualize even the smallest changes at the nanoscale without missing them!

The "Murabiyuwa Series" changes the common sense of inspection. It is a new sensation scope that allows you to confirm "invisible and hard-to-see" defects in a "clear and vivid" manner. It enables visual inspection and evaluation of nano-sized fine polishing marks, orange peel, scratches remaining on the surfaces of glass, crystal, sapphire, and fine grain patterns and crystal defects inside, leading to improved management of surface roughness, setting of polishing conditions, and significantly enhancing yield after deposition.

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  • ムラビューワー２.png
  • Visual Inspection Equipment
  • Surface defect inspection equipment

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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment
  • Surface defect inspection equipment

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment
  • Surface defect inspection equipment

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