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Surface defect inspection equipment - メーカー・企業と製品の一覧

Surface defect inspection equipmentの製品一覧

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Collaborative Project Product Series

Collaborative Project Product Series

Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.

  • Other inspection equipment and devices

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Marking Device Series

Marking Device Series

A wide variety of options are available, including compact and lightweight types, as well as models compatible with clean environments!

Ayaha Engineering offers a variety of "marking devices" tailored to product sizes, processing lines, and detected defects, ranging from film inspection, sheet inspection, and web inspection to non-woven fabric inspection, electrode sheet inspection, copper plate inspection, steel plate inspection, and metal foil inspection. The "AMK-Mini" separates the control box from the main unit, achieving ultra-compact and ultra-lightweight design. This allows for installation in locations that were previously difficult to access. Additionally, we have options like the "AMK-Clean," which can be installed in clean environments, and the controller-integrated type "AMK-S1." 【Features (AMK-Mini)】 ■ Separation of the control box from the main unit for ultra-compact and ultra-lightweight design ■ Enables installation in locations that were previously difficult to access ■ Standard equipped with label remaining quantity monitoring function ■ Signal output when labels run out using a countdown method *For more details, please contact us.

  • Other inspection equipment and devices
  • Other markings

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Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. Not only does simultaneous irradiation with multiple lasers allow for high-sensitivity detection of scratches, but it also determines the uneven shapes of the defects. Features: - Detection of micro defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Full auto-focus - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

  • others

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Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customizable options ■ Supports automatic inspection of one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

Don't overlook any shortcomings even on high-speed lines! This product is a must-see for anyone involved in the production lines of the three-product industry!

"Mujiken-Ex" is a system that inspects surface defects (such as scratches, dirt, and foreign objects) on plain materials like film, paper, and metal, which are transported at high speeds in various production and processing environments. It is also suitable for inspecting materials used for containers, packaging, and labels in cosmetics and pharmaceuticals. If the material is in a web (sheet) form, it can inspect a wide variety of products without selecting the measured object or substrate. By hardware (board) implementing a self-developed high-speed processing circuit dedicated to inspection, it achieves approximately twice the image processing of standard machines while maintaining a high level of accuracy in appearance inspection. 【Features】 ■ Image Processing: High-speed image processing capabilities with a rich set of algorithms ■ Optical System: High-speed compatible cameras. Long-distance and high-speed communication support ■ Diverse system configurations *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices

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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment

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